NO<SUB>x</SUB> Removal by Intense, Pulsed Relativistic Electron Beam
نویسندگان
چکیده
منابع مشابه
Focusing of an Intense Relativistic Electron Beam by a Hollow Conical Laser Beam *
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
متن کاملStimulated Raman Scattering by an Intense Relativistic Electron Beam Subjected to a Rippled Electric Field
Generation of submillimeter radiation by stimulated Raman scattering in an intense relativistic electron beam subjected to a spatially periodic transverse electric field is examined. The requisite electric field modulation can be obtained by rippling the wall of the conducting drift tube. When the electron beam is subjected to a periodic longitudinal electric field, short wavelength plasmons, r...
متن کاملPulsed Electron-Beam Heating
A pulsed, 20 kv electron beam is focussed upon a vapor-deposited thermocouple, and the resulting temperature vs. time response is studied. The experimental data show much scatter, but are consistent with the theoretical prediction that the characteristic thermal response time T is proportional to d , where d is the beam diameter at the thermocouple. From these data, for the soft-glass substrate...
متن کاملNanofabrication by advanced electron microscopy using intense and focused beam∗.
The nanogrowth and nanofabrication of solid substances using an intense and focused electron beam are reviewed in terms of the application of scanning and transmission electron microscopy (SEM, TEM and STEM) to control the size, position and structure of nanomaterials. The first example discussed is the growth of freestanding nanotrees on insulator substrates by TEM. The growth process of the n...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEJ Transactions on Fundamentals and Materials
سال: 2002
ISSN: 0385-4205,1347-5533
DOI: 10.1541/ieejfms.122.302